Autor/in Gu, Xiaoxiong Kwark, Young Hoon 4 Schuster, Christian 4 Kotzev, Miroslav A. 3 Baks, Christian W. 2 Duan, Xiaomin 2 Müller, Sebastian 2 Rimolo-Donadio, Renato 2 Archambeault, Bruce 1 Brüns, Heinz-Dietrich 1 Cho, Jonghyun 1 Fan, Jun 1 Han, Ki Jin 1 Kim, Joungho 1 Ruehli, Albert 1 Zhang, Yao Jiang 1 alle zeigenListe einklappen
A through-silicon-via to active device noise coupling study for CMOS SOI technology Duan, Xiaomin Gu, Xiaoxiong Cho, Jonghyun Kim, Joungho 2011 - TUHH Open Research
Validation and application of physics-based via models to dense via arrays Gu, Xiaoxiong Kwark, Young Hoon Zhang, Yao Jiang Fan, Jun Ruehli, Albert Kotzev, Miroslav A. Müller, Sebastian 2011 - TUHH Open Research
Impact of multiple scattering on passivity of equivalent-circuit via models Duan, Xiaomin Rimolo-Donadio, Renato Müller, Sebastian Han, Ki Jin Gu, Xiaoxiong Kwark, Young Hoon Brüns, Heinz-Dietrich 2011 - TUHH Open Research
Novel multiport probing fixture for high frequency measurements in dense via arrays Kwark, Young Hoon Kotzev, Miroslav A. Baks, Christian W. Gu, Xiaoxiong Schuster, Christian 2011 - TUHH Open Research
Electrical performance of a multiport interposer for measurements of dense via arrays Kotzev, Miroslav A. Kwark, Young Hoon Baks, Christian W. Gu, Xiaoxiong Schuster, Christian 2011 - TUHH Open Research