Autor/in Schwanke, Dieter Pohlner, Jürgen 5 Reppe, Günter 5 Drüe, Karl-Heinz 3 Hein, Matthias 3 Müller, Jens 3 Perrone, Rubén Ariel 3 Stephan, Ralf 3 Baras, Torben 2 Jacob, Arne F. 2 Kulke, Reinhard 2 Molke, Alexander 2 Quahs, Dany 2 Schwarz, Andreas 2 Trabert, Johannes 2 Uhlig, Peter 2 Bittner, Achim 1 Kutscher, C. 1 Kölpin, Alexander 1 Rittweg, Thomas 1 Schmid, Ulrich 1 Steinhäußer, Frank 1 Talai, Armin 1 Thust, Heiko 1 Trabert, Johannes F. 1 Weigel, Robert 1 alle zeigenListe einklappen
Embedded cavity based dielectric loss measurements for LTCC substrates up to 110 GHz Talai, Armin Steinhäußer, Frank Bittner, Achim Schmid, Ulrich Weigel, Robert Schwanke, Dieter Rittweg, Thomas 2016 - TUHH Open Research
Environmental Evaluation of LTCC Surface Mount Technology for Satellite Applications Baras, Torben Molke, Alexander Schwarz, Andreas Reppe, Günter Pohlner, Jürgen Quahs, Dany Schwanke, Dieter 2008 - TUHH Open Research
Environmental evaluation of LTCC flip-chip and surface mount technology for satellite applications Baras, Torben Molke, Alexander Schwarz, Andreas Reppe, Günter Pohlner, Jürgen Quahs, Dany Schwanke, Dieter 2008 - TUHH Open Research
Comparison of high-resolution patterning technologies for LTCC microwave circuits Müller, Jens Perrone, Rubén Ariel Drüe, Karl-Heinz Stephan, Ralf Trabert, Johannes F. Hein, Matthias Schwanke, Dieter 2007 - TUHH Open Research
Comparison of high resolution patterning technologies for LTCC microwave circuits Müller, Jens Perrone, Rubén Ariel Drüe, Karl-Heinz Stephan, Ralf Trabert, Johannes Hein, Matthias Schwanke, Dieter 2007 - TUHH Open Research
Technology benchmarking of high resolution structures on LTCC for microwave circuits Müller, Jens Perrone, Rubén Ariel Thust, Heiko Drüe, Karl-Heinz Kutscher, C. Stephan, Ralf Trabert, Johannes 2006 - TUHH Open Research